Elyse Rosenbaum: search on Z-Library

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1

Comprehensive ESD protection for RF inputs

Sami Hyvonen, Sopan Joshi, Elyse Rosenbaum

Journal:

Microelectronics Reliability

Year:

2005

Language:

english

File:

PDF, 498 KB

english, 2005

2

[IEEE 2010 IEEE International Reliability Physics Symposium - Garden Grove (Anaheim), CA, USA (2010.05.2-2010.05.6)] 2010 IEEE International Reliability Physics Symposium - Predictive simulation of CDM events to study effects of package, substrate resistivity and placement of ESD protection circuits on reliability of integrated circuits

Shukla, Vrashank, Jack, Nathan, Rosenbaum, Elyse

Year:

2010

Language:

english

File:

PDF, 1.37 MB

english, 2010

3

Prediction of Charged Device Model Peak Discharge Current for Microelectronic Components

Shukla, Vrashank, Boselli, Gianluca, Dissegna, Mariano, Duvvury, Charvaka, Sankaralingam, Raj, Rosenbaum, Elyse

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2014

Language:

english

File:

PDF, 1.52 MB

english, 2014

4

Charged Device Model Reliability of Three-Dimensional Integrated Circuits

Shukla, Vrashank, Rosenbaum, Elyse

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2015

Language:

english

File:

PDF, 1.48 MB

english, 2015

5

ESD Self-Protection of High-Speed Transceivers Using Adaptive Active Bias Conditioning

Keel, Min-Sun, Rosenbaum, Elyse

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2017

Language:

english

File:

PDF, 1.68 MB

english, 2017

6

Electrothermal model for simulation of bulk-Si and SOI diodes in ESD protection circuits

Yu Wang, Patrick Juliano, Sopan Joshi, Elyse Rosenbaum

Journal:

Microelectronics Reliability

Year:

2001

Language:

english

File:

PDF, 492 KB

english, 2001

7

Trap generation and breakdown processes in very thin gate oxides

Elyse Rosenbaum, Jie Wu

Journal:

Microelectronics Reliability

Year:

2001

Language:

english

File:

PDF, 173 KB

english, 2001

8

A new compact model for external latchup

Farzan Farbiz, Elyse Rosenbaum

Journal:

Microelectronics Reliability

Year:

2009

Language:

english

File:

PDF, 953 KB

english, 2009

9

[IEEE 2010 IEEE International Reliability Physics Symposium - Garden Grove (Anaheim), CA, USA (2010.05.2-2010.05.6)] 2010 IEEE International Reliability Physics Symposium - Understanding transient latchup hazards and the impact of guard rings

Farbiz, Farzan, Rosenbaum, Elyse

Year:

2010

Language:

english

File:

PDF, 593 KB

english, 2010

10

[IEEE 2007 29th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) - Anaheim, CA, USA (2007.09.16-2007.09.21)] 2007 29th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) - A novel testing approach for full-chip CDM characterization

Gerdemann, Alex, Rosenbaum, Elyse, Stockinger, Michael

Year:

2007

Language:

english

File:

PDF, 827 KB

english, 2007

11

Modeling and Understanding of External Latchup in CMOS Technologies—Part I: Modeling Latchup Trigger Current

Farbiz, Farzan, Rosenbaum, Elyse

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2011

Language:

english

File:

PDF, 929 KB

english, 2011

12

Comparison of FICDM and Wafer-Level CDM Test Methods

Jack, Nathan, Rosenbaum, Elyse

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2013

Language:

english

File:

PDF, 1.18 MB

english, 2013

13

Modeling and Understanding of External Latchup in CMOS Technologies—Part II: Minority Carrier Collection Efficiency

Farbiz, Farzan, Rosenbaum, Elyse

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2011

Language:

english

File:

PDF, 808 KB

english, 2011

14

Diode-Triggered Silicon-Controlled Rectifier With Reduced Voltage Overshoot for CDM ESD Protection

Chen, Wen-Yi, Rosenbaum, Elyse, Ker, Ming-Dou

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2012

Language:

english

File:

PDF, 1.13 MB

english, 2012

15

[IEEE 2011 IEEE Custom Integrated Circuits Conference - CICC 2011 - San Jose, CA, USA (2011.09.19-2011.09.21)] 2011 IEEE Custom Integrated Circuits Conference (CICC) - CDM-ESD induced damage in components using stacked-die packaging

Olson, Nicholas, Jack, Nathan, Shukla, Vrashank, Rosenbaum, Elyse

Year:

2011

Language:

english

File:

PDF, 754 KB

english, 2011

16

[ACM Press the 36th ACM/IEEE conference - New Orleans, Louisiana, United States (1999.06.21-1999.06.25)] Proceedings of the 36th ACM/IEEE conference on Design automation conference - DAC '99 - Substrate modeling and lumped substrate resistance extraction for CMOS ESD/latchup circuit simulation

Li, Tong, Tsai, Ching-Han, Rosenbaum, Elyse, Kang, Sung-Mo

Year:

1999

Language:

english

File:

PDF, 827 KB

english, 1999

17

[IEEE 2015 37th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) - Reno, NV, USA (2015.9.27-2015.10.2)] 2015 37th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) - Fast circuit simulator for transient analysis of CDM ESD

Kuo-Hsuan Meng,, Rosenbaum, Elyse

Year:

2015

Language:

english

File:

PDF, 1.25 MB

english, 2015

18

Analysis and Design of Integrated Voltage Regulators for Supply Noise Rejection During System-Level ESD

Xiu, Yang, Rosenbaum, Elyse

Journal:

IEEE Transactions on Circuits and Systems I: Regular Papers

Year:

2020

File:

PDF, 3.02 MB

2020

19

Simulator-independent compact modeling of vertical npn transistors for ESD and RF circuit simulation

Sopan Joshi, Elyse Rosenbaum

Journal:

Microelectronics Reliability

Year:

2003

Language:

english

File:

PDF, 175 KB

english, 2003

20

[IEEE 2010 IEEE International Reliability Physics Symposium - Garden Grove (Anaheim), CA, USA (2010.05.2-2010.05.6)] 2010 IEEE International Reliability Physics Symposium - ESD protection for high-speed receiver circuits

Jack, Nathan, Rosenbaum, Elyse

Year:

2010

Language:

english

File:

PDF, 380 KB

english, 2010

21

[IEEE 2007 29th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) - Anaheim, CA, USA (2007.09.16-2007.09.21)] 2007 29th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) - Layout guidelines for optimized ESD protection diodes

Bhatia, Karan, Rosenbaum, Elyse

Year:

2007

Language:

english

File:

PDF, 440 KB

english, 2007

22

Comparison of Wafer-Level With Package-Level CDM Stress Facilitated by Real-Time Probing

Jack, Nathan, Shukla, Vrashank, Rosenbaum, Elyse

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2011

Language:

english

File:

PDF, 887 KB

english, 2011

23

[IEEE 2008 IEEE International Electron Devices Meeting (IEDM) - San Francisco, CA, USA (2008.12.15-2008.12.17)] 2008 IEEE International Electron Devices Meeting - Guard Ring Interactions and their Effect on CMOS Latchup Resilience

Farbiz, Farzan, Rosenbaum, Elyse

Year:

2008

Language:

english

File:

PDF, 294 KB

english, 2008

24

[IEEE 2004 Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) - Grapevine, TX, USA (2004.09.19-2004.09.23)] 2004 Electrical Overstress/Electrostatic Discharge Symposium - A compact, timed-shutoff, MOSFET-based power clamp for on-chip ESD protection

Li, Junjun, Gauthier, Robert, Rosenbaum, Elyse

Year:

2004

Language:

english

File:

PDF, 383 KB

english, 2004

25

[IEEE 2011 IEEE International Reliability Physics Symposium (IRPS) - Monterey, CA, USA (2011.04.10-2011.04.14)] 2011 International Reliability Physics Symposium - WCDM2 — Wafer-level charged device model testing with high repeatability

Jack, Nathan, Maloney, Timothy J., Chou, Bruce, Rosenbaum, Elyse

Year:

2011

Language:

english

File:

PDF, 1.38 MB

english, 2011

26

Verification of Snapback Model by Transient $I$–$V$ Measurement for Circuit Simulation of ESD Response

Meng, Kuo-Hsuan, Rosenbaum, Elyse

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2013

Language:

english

File:

PDF, 1.30 MB

english, 2013

27

[IEEE 2008 IEEE International Reliability Physics Symposium (IRPS) - Phoenix, AZ, USA (2008.04.27-2008.05.1)] 2008 IEEE International Reliability Physics Symposium - A scalable SCR compact model for ESD circuit simulation

Di Sarro, James, Rosenbaum, Elyse

Year:

2008

Language:

english

File:

PDF, 395 KB

english, 2008

28

[IEEE 2012 IEEE Custom Integrated Circuits Conference - CICC 2012 - San Jose, CA, USA (2012.09.9-2012.09.12)] Proceedings of the IEEE 2012 Custom Integrated Circuits Conference - FEC-based 4 Gb/s backplane transceiver in 90nm CMOS

Faust, Adam C., Narasimha, Rajan Lakshmi, Bhatia, Karan, Srivastava, Ankit, Kong, Chhay, Bae, Hyeon-Min, Rosenbaum, Elyse, Shanbhag, Naresh

Year:

2012

Language:

english

File:

PDF, 462 KB

english, 2012

29

[IEEE 2012 IEEE International Reliability Physics Symposium (IRPS) - Anaheim, CA, USA (2012.04.15-2012.04.19)] 2012 IEEE International Reliability Physics Symposium (IRPS) - Layout sensitivities of transient external latchup

Kripanidhi, Arjun, Rosenbaum, Elyse

Year:

2012

Language:

english

File:

PDF, 985 KB

english, 2012

30

[IEEE 2007 29th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) - Anaheim, CA, USA (2007.09.16-2007.09.21)] 2007 29th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) - Analytical modeling of external latchup

Farbiz, Farzan, Rosenbaum, Elyse

Year:

2007

Language:

english

File:

PDF, 362 KB

english, 2007

31

[IEEE 2009 IEEE Custom Integrated Circuits Conference (CICC) - San Jose, CA, USA (2009.09.13-2009.09.16)] 2009 IEEE Custom Integrated Circuits Conference - Moving signals on and off chip

Rosenbaum, Elyse, Bae, Hyeon-Min, Faust, Adam C.

Year:

2009

Language:

english

File:

PDF, 882 KB

english, 2009

32

Analysis of Active-Clamp Response to Power-On ESD: Power Supply Integrity and Performance Tradeoffs

Mertens, Robert, Thomson, Nicholas, Xiu, Yang, Rosenbaum, Elyse

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2015

Language:

english

File:

PDF, 1.24 MB

english, 2015

33

Piecewise-Linear Model With Transient Relaxation for Circuit-Level ESD Simulation

Meng, Kuo-Hsuan, Mertens, Robert, Rosenbaum, Elyse

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2015

Language:

english

File:

PDF, 611 KB

english, 2015

34

[IEEE 2015 Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC) - Taipei, Taiwan (2015.5.26-2015.5.29)] 2015 Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC) - Current challenges in component-level and system-level ESD simulation

Rosenbaum, Elyse, Meng, Kuo-Hsuan, Xiu, Yang, Thomson, Nicholas

Year:

2015

Language:

english

File:

PDF, 934 KB

english, 2015

35

CDM-Reliable T-coil Techniques for a 25-Gb/s Wireline Receiver Front-End

Keel, Min-Sun, Rosenbaum, Elyse

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2016

Language:

english

File:

PDF, 4.50 MB

english, 2016

36

[IEEE 2016 38th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) - Garden Grove, CA, USA (2016.9.11-2016.9.16)] 2016 38th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) - Application level investigation of system-level ESD-induced soft failures

Vora, Sandeep, Jiang, Rui, Vasudevan, Shobha, Rosenbaum, Elyse

Year:

2016

Language:

english

File:

PDF, 395 KB

english, 2016

37

Soft-Failures Induced by System-Level ESD

Thomson, Nicholas A., Xiu, Yang, Rosenbaum, Elyse

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2017

Language:

english

File:

PDF, 1.43 MB

english, 2017

38

[IEEE 2016 IEEE Electrical Design of Advanced Packaging and Systems (EDAPS) - Honolulu, HI (2016.12.14-2016.12.16)] 2016 IEEE Electrical Design of Advanced Packaging and Systems (EDAPS) - Tutorial I: Influence of IC packaging technology on ESD robustness of components

Rosenbaum, Elyse

Year:

2016

Language:

english

File:

PDF, 168 KB

english, 2016

39

[IEEE 2018 40th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) - Reno, NV, USA (2018.9.23-2018.9.28)] 2018 40th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) - Latch-up Model of Non-collinear PNPN Structures

Reiman, Collin, Jack, Nathan, Rosenbaum, Elyse

Year:

2018

Language:

english

File:

PDF, 440 KB

english, 2018

40

[IEEE 2020 IEEE International Reliability Physics Symposium (IRPS) - Dallas, TX, USA (2020.4.28-2020.5.30)] 2020 IEEE International Reliability Physics Symposium (IRPS) - An Interpretable Predictive Model for Early Detection of Hardware Failure

Balakir, Artsiom, Yang, Alan, Rosenbaum, Elyse

Year:

2020

File:

PDF, 1.32 MB

2020

41

Analytic model for direct tunneling current in polycrystalline silicon-gate metal–oxide–semiconductor devices

Register, Leonard F., Rosenbaum, Elyse, Yang, Kevin

Journal:

Applied Physics Letters

Year:

1999

Language:

english

File:

PDF, 340 KB

english, 1999

42

[IEEE 2010 IEEE International Reliability Physics Symposium - Garden Grove (Anaheim), CA, USA (2010.05.2-2010.05.6)] 2010 IEEE International Reliability Physics Symposium - A novel TCAD-based methodology to minimize the impact of parasitic structures on ESD performance

Olson, Nicholas, Boselli, Gianluca, Salman, Akram, Rosenbaum, Elyse

Year:

2010

Language:

english

File:

PDF, 489 KB

english, 2010

43

[IEEE IEEE Custom Integrated Circuits Conference 2006 - San Jose, CA, USA (2006.09.10-2006.09.13)] IEEE Custom Integrated Circuits Conference 2006 - An 8-mW, ESD-protected, CMOS LNA for Ultra-Wideband Applications

Bhatia, Karan, Hyvonen, Sami, Rosenbaum, Elyse

Year:

2006

Language:

english

File:

PDF, 467 KB

english, 2006

44

[IEEE 2006 IEEE International Reliability Physics Symposium Proceedings - San Jose, CA, USA (2006.03.26-2006.03.30)] 2006 IEEE International Reliability Physics Symposium Proceedings - SOI Poly-defined Diode for ESD Protection in High Speed I/Os

Chen, Victor, Salman, Akram, Beebe, Stephen, Rosenbaum, Elyse, Mitra, Souvick, Putnam, Chris, Gauthier, Robert

Year:

2006

Language:

english

File:

PDF, 103 KB

english, 2006

45

[IEEE 2010 Proceedings 60th Electronic Components and Technology Conference (ECTC) - Las Vegas, NV, USA (2010.06.1-2010.06.4)] 2010 Proceedings 60th Electronic Components and Technology Conference (ECTC) - Application of the latency insertion method (LIM) to the modeling of CDM ESD events

Klokotov, Dmitri, Shukla, Vrashank, Schutt-Aine, Jose, Rosenbaum, Elyse

Year:

2010

Language:

english

File:

PDF, 514 KB

english, 2010

46

[IEEE APCCAS 2008 - 2008 IEEE Asia Pacific Conference on Circuits and Systems (APCCAS) - Macao, China (2008.11.30-2008.12.3)] APCCAS 2008 - 2008 IEEE Asia Pacific Conference on Circuits and Systems - UVeriESD: An ESD verification tool for SoC design

Hsueh, K. Kelvin, Sin-Hao Ke,, Lee, Jeffrey, Rosenbaum, Elyse

Year:

2008

Language:

english

File:

PDF, 1.82 MB

english, 2008

47

[IEEE 2012 IEEE International Reliability Physics Symposium (IRPS) - Anaheim, CA, USA (2012.04.15-2012.04.19)] 2012 IEEE International Reliability Physics Symposium (IRPS) - Exponential-edge transmission line pulsing for snap-back device characterization

Thomson, Nicholas, Jack, Nathan, Rosenbaum, Elyse

Year:

2012

Language:

english

File:

PDF, 349 KB

english, 2012

48

[IEEE 2004 Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) - Grapevine, TX, USA (2004.09.19-2004.09.23)] 2004 Electrical Overstress/Electrostatic Discharge Symposium - Improved wafer-level VFTLP system and investigation of device turn-on effects

Li, Junjun, Hyvonen, Sami, Rosenbaum, Elyse

Year:

2004

Language:

english

File:

PDF, 416 KB

english, 2004

49

[IEEE 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual - Phoenix, AZ, USA (2007.04.15-2007.04.19)] 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual - An Investigation of External Latchup

Farbiz, Farzan, Rosenbaum, Elyse

Year:

2007

Language:

english

File:

PDF, 2.31 MB

english, 2007

50

[IEEE 2007 29th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) - Anaheim, CA, USA (2007.09.16-2007.09.21)] 2007 29th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) - A Kelvin transmission line pulsing system with optimized oscilloscope ranging

Gerdemann, Alex, Bhatia, Karan, Rosenbaum, Elyse

Year:

2007

Language:

english

File:

PDF, 439 KB

english, 2007